Influence of Cr substitution on electrical and dielectric properties of monovalent doped Pr-based manganites

Siti Sumaiyah Sheikh Abdul Aziz; Nor Asmira Amaran; Rozilah Rajmi; Sikiru Surajudeen Olalekan; Zakiah Mohamed; Norazila Ibrahim; Siti Sumaiyah Sheikh Abdul Aziz; Nor Asmira Amaran; Rozilah Rajmi; Sikiru Surajudeen Olalekan; Zakiah Mohamed; Norazila Ibrahim

doi:10.3934/matersci.2025040

AIMS Materials Science

2025, Volume 12, Issue 4: 909-927. doi: 10.3934/matersci.2025040

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Influence of Cr substitution on electrical and dielectric properties of monovalent doped Pr-based manganites

1.
Faculty of Applied Sciences, Universiti Teknologi MARA (UiTM), Perak Branch, Tapah Campus, 35400 Tapah Road, Perak, Malaysia
2.
Faculty of Applied Sciences, Universiti Teknologi MARA (UiTM), 40450 Shah Alam, Selangor, Malaysia
3.
Faculty of Applied Sciences, Universiti Teknologi MARA (UiTM), Perlis Branch, Arau Campus, 02600 Arau, Perlis, Malaysia

Received: 03 July 2025 Revised: 28 August 2025 Accepted: 02 September 2025 Published: 10 September 2025

Polycrystalline Pr_0.75Na_0.05K_0.20Mn_1-xCr_xO₃ (x = 0.00, 0.01, 0.02, 0.03, 0.04, 0.05) manganites were synthesized by the solid-state reaction method to examine the role of Chromium (Cr) substitution on structural, electrical, and dielectric behavior. X-ray diffraction (XRD) with Rietveld refinement confirmed a single-phase orthorhombic (Pnma) structure with Cr³⁺ incorporation at Mn³⁺/Mn⁴⁺ sites, reflected in compositional changes of unit cell volume. Field-emission scanning electron microscopy (FESEM) revealed grain refinement with increasing Cr, indicating inhibited grain growth and enhanced grain boundary density. Impedance spectroscopy showed a conduction shift from bulk-dominated (x ≤ 0.02) to grain boundary-controlled (x ≥ 0.03), with higher Cr levels producing non-Debye relaxation due to carrier localization. Dielectric studies demonstrated frequency-dependent dispersion, where Cr substitution suppressed dielectric constant, dielectric loss, and loss tangent by reducing space-charge and grain boundary effects. The x = 0.02 composition exhibited the most stable dielectric response. These findings establish Cr doping as an effective strategy for tailoring structure-property correlations and enhancing dielectric stability in perovskite manganites.
- microstructure,
- dielectric properties,
- grain boundaries,
- grain size,
- perovskites
Citation: Siti Sumaiyah Sheikh Abdul Aziz, Nor Asmira Amaran, Rozilah Rajmi, Sikiru Surajudeen Olalekan, Zakiah Mohamed, Norazila Ibrahim. Influence of Cr substitution on electrical and dielectric properties of monovalent doped Pr-based manganites[J]. AIMS Materials Science, 2025, 12(4): 909-927. doi: 10.3934/matersci.2025040

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Abstract

Polycrystalline Pr_0.75Na_0.05K_0.20Mn_1-xCr_xO₃ (x = 0.00, 0.01, 0.02, 0.03, 0.04, 0.05) manganites were synthesized by the solid-state reaction method to examine the role of Chromium (Cr) substitution on structural, electrical, and dielectric behavior. X-ray diffraction (XRD) with Rietveld refinement confirmed a single-phase orthorhombic (Pnma) structure with Cr³⁺ incorporation at Mn³⁺/Mn⁴⁺ sites, reflected in compositional changes of unit cell volume. Field-emission scanning electron microscopy (FESEM) revealed grain refinement with increasing Cr, indicating inhibited grain growth and enhanced grain boundary density. Impedance spectroscopy showed a conduction shift from bulk-dominated (x ≤ 0.02) to grain boundary-controlled (x ≥ 0.03), with higher Cr levels producing non-Debye relaxation due to carrier localization. Dielectric studies demonstrated frequency-dependent dispersion, where Cr substitution suppressed dielectric constant, dielectric loss, and loss tangent by reducing space-charge and grain boundary effects. The x = 0.02 composition exhibited the most stable dielectric response. These findings establish Cr doping as an effective strategy for tailoring structure-property correlations and enhancing dielectric stability in perovskite manganites.

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