Research article Topical Sections

Study of oxide/metal/oxide thin films for transparent electronics and solar cells applications by spectroscopic ellipsometry

  • A comprehensive study of a class of Oxide/Metal/Oxide (Oxide = ITO, AZO, TiO2 and Bi2O3, Metal = Au) thin films was done by correlating the spectrophotometric studies with the ellispometric models. Films were deposited by successive sputtering from metallic targets In:Sn, Zn:Al, Ti and Bi in reactive atmosphere (for the oxide films) and respective inert atmosphere (for the metallic Au interlayer films) on glass substrates. The measurements of optical constants n—the refractive index and k—the extinction coefficient, at different incident photon energies for single oxide films and also for the three layers films oxide/metal/oxide samples were made using the spectroscopic ellipsometry (SE) technique. The ellipsometry modelling process was coupled with the recorded transmission spectra data of a double beam spectrophotometer and the best fitting parameters were obtained not only by fitting the n and k experimental data with the dispersion fitting curves as usual is practiced in the most reported data in literature, but also by comparing the calculated the transmission coefficient from ellipsometry with the experimental values obtained from direct spectrophotometry measurements. In this way the best dispersion model was deduced for each sample. Very good correlations were obtained for the other different thin films characteristics such as the films thickness, optical band gap and electrical resistivity obtained by other measurements and calculation techniques. The ellipsometric modelling, can hence give the possibility in the future to predict, by ellipsometric simulations, the proper device architecture in function of the preferred optical and electrical properties.

    Citation: Mihaela Girtan, Laura Hrostea, Mihaela Boclinca, Beatrice Negulescu. Study of oxide/metal/oxide thin films for transparent electronics and solar cells applications by spectroscopic ellipsometry[J]. AIMS Materials Science, 2017, 4(3): 594-613. doi: 10.3934/matersci.2017.3.594

    Related Papers:

    [1] Dong-Gun Lee, Yeong-Seok Seo . Identification of propagated defects to reduce software testing cost via mutation testing. Mathematical Biosciences and Engineering, 2022, 19(6): 6124-6140. doi: 10.3934/mbe.2022286
    [2] Zita Abreu, Guillaume Cantin, Cristiana J. Silva . Analysis of a COVID-19 compartmental model: a mathematical and computational approach. Mathematical Biosciences and Engineering, 2021, 18(6): 7979-7998. doi: 10.3934/mbe.2021396
    [3] Raghavendra Rao Althar, Abdulrahman Alahmadi, Debabrata Samanta, Mohammad Zubair Khan, Ahmed H. Alahmadi . Mathematical foundations based statistical modeling of software source code for software system evolution. Mathematical Biosciences and Engineering, 2022, 19(4): 3701-3719. doi: 10.3934/mbe.2022170
    [4] Nan Xu, Guolei Zhang, Longbin Yang, Zhenyu Shen, Min Xu, Lei Chang . Research on thermoeconomic fault diagnosis for marine low speed two stroke diesel engine. Mathematical Biosciences and Engineering, 2022, 19(6): 5393-5408. doi: 10.3934/mbe.2022253
    [5] Zulin Xu . An intelligent fault detection approach for digital integrated circuits through graph neural networks. Mathematical Biosciences and Engineering, 2023, 20(6): 9992-10006. doi: 10.3934/mbe.2023438
    [6] Yung-Pin Cheng, Ching-Wei Li, Yi-Cheng Chen . Apply computer vision in GUI automation for industrial applications. Mathematical Biosciences and Engineering, 2019, 16(6): 7526-7545. doi: 10.3934/mbe.2019378
    [7] Qiushi Wang, Zhicheng Sun, Yueming Zhu, Chunhe Song, Dong Li . Intelligent fault diagnosis algorithm of rolling bearing based on optimization algorithm fusion convolutional neural network. Mathematical Biosciences and Engineering, 2023, 20(11): 19963-19982. doi: 10.3934/mbe.2023884
    [8] Xinglong Yin, Lei Liu, Huaxiao Liu, Qi Wu . Heterogeneous cross-project defect prediction with multiple source projects based on transfer learning. Mathematical Biosciences and Engineering, 2020, 17(2): 1020-1040. doi: 10.3934/mbe.2020054
    [9] Zhibin Zuo, Rongyu He, Xianwei Zhu, Chaowen Chang . A novel software-defined network packet security tunnel forwarding mechanism. Mathematical Biosciences and Engineering, 2019, 16(5): 4359-4381. doi: 10.3934/mbe.2019217
    [10] Fuhua Wang, Zongdong Zhang, Kai Wu, Dongxiang Jian, Qiang Chen, Chao Zhang, Yanling Dong, Xiaotong He, Lin Dong . Artificial intelligence techniques for ground fault line selection in power systems: State-of-the-art and research challenges. Mathematical Biosciences and Engineering, 2023, 20(8): 14518-14549. doi: 10.3934/mbe.2023650
  • A comprehensive study of a class of Oxide/Metal/Oxide (Oxide = ITO, AZO, TiO2 and Bi2O3, Metal = Au) thin films was done by correlating the spectrophotometric studies with the ellispometric models. Films were deposited by successive sputtering from metallic targets In:Sn, Zn:Al, Ti and Bi in reactive atmosphere (for the oxide films) and respective inert atmosphere (for the metallic Au interlayer films) on glass substrates. The measurements of optical constants n—the refractive index and k—the extinction coefficient, at different incident photon energies for single oxide films and also for the three layers films oxide/metal/oxide samples were made using the spectroscopic ellipsometry (SE) technique. The ellipsometry modelling process was coupled with the recorded transmission spectra data of a double beam spectrophotometer and the best fitting parameters were obtained not only by fitting the n and k experimental data with the dispersion fitting curves as usual is practiced in the most reported data in literature, but also by comparing the calculated the transmission coefficient from ellipsometry with the experimental values obtained from direct spectrophotometry measurements. In this way the best dispersion model was deduced for each sample. Very good correlations were obtained for the other different thin films characteristics such as the films thickness, optical band gap and electrical resistivity obtained by other measurements and calculation techniques. The ellipsometric modelling, can hence give the possibility in the future to predict, by ellipsometric simulations, the proper device architecture in function of the preferred optical and electrical properties.


    In recent years, the software industry has expanded significantly owing to the increase in demand for software products for non-face-to-face services for various applications (conferences, education, delivery, shopping, etc.). The development and growth of software industries have led to digital innovation, which has increased the use of technology for both work and leisure [1,2,3,4]. For example, let us consider a store where more than 70% of the daily sales occur via card payments. If the card payment machine does not work due to internet failure, the delivery applications will not receive any processing applications, further affecting the sales severely. Internet failures can occur for various reasons, but users using the software will feel very uncomfortable. Like this, software has become an integral part of our lives. Various software programs are used in different industries, and it is difficult and complicated to develop related software. However, the main focus of software development must be to provide high-quality services to customers by improving reliability and stability.

    Various methods are being used to improve software reliability. Among them, software testing is the most widely used method, and software testing is one of the methods to increase software reliability through a series of procedures (code, algorithm, optimization, etc.) to find and improve software faults [5,6]. In the past, software testing was defined as an activity of finding faults to confirm faults in order to check whether an application program or system operates normally and was nothing more than a business activity performed after development. However, in recent years, it refers to the entire process of making decisions through numerical data based on detected faults, such as the early stage of software development and the correction stage. As such, the number of software faults and the time interval between each fault have a significant impact on software reliability, and software reliability can be evaluated more easily by using a software reliability model, i.e., a mathematical model using the number of software faults and the time interval between faults. It can measure the number of software failures, software failure interval and software reliability. Also, as seen in the previous example for internet failure, software faults can occur for a number of reasons, including independent software faults such as code errors and software freezes, and dependent (secondary) causes that lead to other software faults due to code errors.

    Many software reliability models (SRMs) have been developed from the past to the present, among the existing SRMs, the Goel-Okumoto (GO) [7] model is the most preferred model, which is based on the non-homogeneous Poisson process (NHPP). The GO model defines a mean value function (MVF) with an intensity function using an exponential distribution. In this model, the reliability during the mission time is determined by estimating the number of failures that occur while removing the faults remaining in the software. Since then, several researchers have extended the SRM based on the NHPP by, for example, indicating that the cumulative failure number of software failures increases in an S-shape by considering testing efforts or assuming imperfect debugging [8]. Pham and Zhang [9] proposed a generalized NHPP SRM in which the basic assumption is that the rate of change in the number of software faults is proportional to the content of the remaining faults. However, because the developed software has a very complex structure, one failure may affect other failures and thus increase the probability of causing another failure, causing software failures to occur dependently [10]. Pham and Pham [11] proposed an SRM with a dependency relationship assuming incomplete debugging. Lee et al. [12] proposed an SRM whereby dependent faults would be caused by prior software failures, and Kim et al. [13] proposed an SRM whereby software failures occur in a dependent manner. The previously proposed SRMs considered that, even if dependent faults occur, they occur constantly.

    In recent decades, open-source software (OSS) development has been recognized and accepted by the industry and has gradually become an alternative name for software development. Many large companies, such as Microsoft, Google, Baidu and Alibaba, have their own OSS development projects. The development process for this type of software mainly involves the release of new versions of software or open-source projects by software developers, which enables the users to use and test the software to detect any faults in it during the usage process. The detected faults can be either removed by the users or sent to developers via email so that the developers can verify and remove such failures. Moreover, the effective evaluation of the reliability of OSS is a challenging problem. Various SRMs that utilize OSS have been developed. A reliability model used for effectively evaluating the reliability of OSS [14], a multi-release OSS reliability model with dependent fault detection [15], an OSS reliability growth model that considers change points [16] and an integrated OSS reliability model [17] have been used to evaluate the OSS in various ways.

    In this study, when most software-dependent failures occur, dependent defects are considered on the assumption that the probability of rapidly increasing failures increases from the beginning, and, thereafter, the finite number of defects that result in failures occurs at a slow rate until the maximum number of failures is reached. Based on this, we propose a new SRM. In other words, we propose a new SRM that considers the number of finite and dependent defects. In addition, in order to see that the proposed SRM using defect data from OSS, which is a recent trend, is superior to the existing SRMs, the suitability is reviewed based on various criteria.

    The MVF for the new SRM is derived in Section 2 by using the maximum number of fault contents in the software and the time-dependent fault detection rate function. The criteria for model comparisons and the selection of the best model are discussed in Section 3, and the results of each criteria value (CV) and model comparison are discussed in Section 4. Finally, in Section 5, conclusions and remarks are presented.

    By assuming that software failure follows the NHPP, N(t) (t0) is the Poisson probability density function with the parameter m(t), where m(t) is the MVF, which is the expected number of faults detected at time t, and it can be expressed as follows:

    Pr{N(t)=n}={m(t)}nn!exp{m(t)},n=0,1,2,3.

    The MVF m(t) with the failure intensity λ(t) is expressed as follows:

    m(t)=t0λ(s)ds

    The reliability function R(t) of software representing the probability that a software error will not occur within the interval [0, t] is expressed as in Equation (1):

    R(t)=em(t)=et0λ(s)ds (1)

    If t+x is given, then the software reliability can be expressed as a conditional probability R(x|t), as expressed in Equation (2).

    R(x|t)=e[m(t+x)m(t)] (2)

    The MVF m(t) of the generalized NHPP SRM can be obtained by solving the differential equation expressed in Equation (3):

    dm(t)dt=b(t)[a(t)m(t)] (3)

    where a(t) is the expected total number of software failures, and b(t) is the fault detection rate function. Many existing NHPP SRMs have been developed on the premise that software faults occur independently (remove faults immediately if they occur). However, since the software is used in different environments, software faults occur very differently, depending on where the software is operated, and new faults may occur due to existing faults.

    The MVF of the NHPP SRM considering dependent faults can be obtained using the differential equation (4) as shown below.

    dm(t)dt=b(t)[a(t)m(t)]m(t) (4)

    As discussed in Section 2.1, many existing SRMs consider that dependent errors persist, if they do occur. However, when most software-dependent faults occur, there is a high probability that faults will increase rapidly from the beginning, and, subsequently, they occur slowly until the maximum number of faults is reached.

    In this study, we considered a finite number of software faults and dependent faults.

    Thus, the MVF m(t) can be obtained by solving the differential equation (5), with the initial condition m(0)0 [18]:

    dm(t)dt=b(t)[1m(t)a(t)]m(t) (5)

    Here, a(t) and b(t) represent the maximum number of fault contents in the software and the time-dependent fault detection rate function, respectively.

    In this study, the following a(t) and b(t) are considered:

    a(t)=a, b(t)=b2tbt+1

    We obtained a new NHPP SRM that considers a finite number of faults and dependent faults with the initial condition m(0)=k, which can be expressed as

    m(t)=a1+(ak1)(1+bt)ebt

    Table 1 summarizes the MVFs of existing NHPP SRMs and the proposed new NHPP SRM. Existing NHPP SRMs 8, 9, 10 and 11 consider the dependency.

    Table 1.  Existing NHPP SRMs.
    No. Model m(t)
    1 GO [7] m(t)=a(1ebt)
    2 HD-GO [19] m(t)=log[(eac)/(eaebtc)]
    3 Y-DS [20] m(t)=a(1(1+bt)ebt)
    4 O-IS [21] m(t)=a(1ebt)1+βebt
    5 Y-Exp [22] m(t)=a(1eγα(1eβt))
    6 Y-Ray [22] m(t)=a(1eγα(1eβt2/2))
    7 PZ-IFD [23] m(t)=a(1ebt)(1+(b+d)t+bdt2)
    8 P-DP 1 [24] m(t)=α(γt+1))
    9 P-DP 2 [24] m(t)=m0(γt+1γt0+1)eγ(tt0)            +α(γt+1)(γt1+(1γt0)eγ(tt0))
    10 P-DP 3 [18] m(t)=a1+d(1+ββ+ebt)
    11 L-DP [12] m(t)=a1+ah(b+cc+bebt)ab
    12 New model m(t)=a1+(ak1)(1+bt)ebt

     | Show Table
    DownLoad: CSV

    In order to compare the performance of the model, we use 12 criteria for model comparison. They are the mean squared error (MSE), the predicted relative variation (PRV), the root mean square prediction error (RMSPE), the sum of absolute errors (SAE), the mean absolute error (MAE), the mean error of prediction (MEOP), the Theil statistics (TS), the predictive ration risk (PRR), Pham's information criterion (PIC), Pham's criterion (PC), R2 and the adjusted R2 (AdjR2). The CVs are obtained by using the difference between the actual value and the predicted value. Some criteria are sensitive to outliers and others are not. This shows the superiority of a given model by comparing many scales without using one scale for various reasons.

    In Table 2, yi and ˆm(ti) represent the total number of failures and the estimated cumulative number of failures, respectively. n and m denote the total number of observations and the number of unknown parameters in the model, respectively. In Table 2, from 1–10, the smaller those values, the better the model performance (close to zero). From 11–12, the higher those values, the better the model performance (close to one).

    Table 2.  Criteria for model comparison.
    No. Criteria function
    1 MSE MSE=ni=1(ˆm(ti)yi)2nm
    2 PRV [25] PRV=ni=1(yiˆm(ti)Bias)2n1
    3 RMSPE [26] RMSPE=Variance2+Bias2
    4 SAE [27] SAE=ni=1|ˆm(ti)yi|
    5 MSE [27] MAE=ni=1|ˆm(ti)yi|nm
    6 MEOP [28] MEOP=ni=1|ˆm(ti)yi|nm+1
    7 TS [29] TS=100ni=1(yiˆm(ti))2ni=1yi2%
    8 PRR [30] PRR=ni=1(ˆm(ti)yiˆm(ti))2
    9 PIC [30] PIC=ni=1(ˆm(ti)yi)2+m(n1nm)
    10 PC [30] PC=(nm2)log(ni=1(ˆm(ti)yi)2n)+m(n1nm)
    11 R2 [31] R2=1ni=1(ˆm(ti)yi)2ni=1(yi¯yi)2
    12 Adj R2 [31] AdjR2=1(1R2)(n1)nm1

     | Show Table
    DownLoad: CSV

    The variance and bias are given:

    Variance=ni=1(yiˆm(ti)Bias)2n1,Bias=1nni=1(ˆm(ti)yi).

    We described 12 criteria in Section 3.1 to compare the performance of NHPP SRMs. Since there are various comparison criteria, it is difficult to select a criterion first and check the performance of the SRM. Therefore, the criterion method to integrate them is needed. Therefore, a new integrated criterion was proposed by considering the value and ranking of each criterion. Earlier, Li and Pham [31] described a criterion for ranking the best models by using the distance of the regularization criterion method.

    Because the CVs and rankings for model comparison are different, we have proposed an integrated comparison criterion method that considers the average of each criterion and the average of the rankings of each criterion. The average value of the normalized criteria and ranking (AC value) of the model is defined as follows:

    ACvlaue=1k2k=1(dj=1Cijksi=1Cijk+fj=11Zijksi=1(1Zijk)(d+f))

    where s is the total number of models; Cij denotes the criterion value of the ith model of the jth criterion, where i=1,2,,s; d is the total number of certain criteria (MSE, PRV, RMSPE, MAE, MEOP, TS, PIC and PC); f is the total number of the remaining criteria (R2 and AdjR2). k=1 denotes the d and f values of the criteria, and k=2 denotes the d and f rankings of the criteria.

    We downloaded all of the fixed issues for products, namely, Apache IoTDB (IoTDB, database for Internet of Things) of the Apache open-source project from the Apache issue tracking system (https://iotdb.apache.org/). Bugs (Bugs), new features (NFs) and feature improvements (IPMs) have been presented with different symbols. Only those issues that did not duplicate and were reproducible for others were selected. Briefly, the Apache IoTDB is an integrated data management engine designed for time-series data. Additional information can be found at https://iotdb.apache.org/. Data were collected for different issue types on a monthly basis from January 2019 to January 2022. The proposed model only considered dependent faults; therefore, we did not consider the independent issue, but reflected the dependent issue and constructed the dataset, as listed in Table 3. In Table 3, Dataset 1 has a cumulative number of failures of 3, 5, ..., 260 at t = 1, 2, ..., 36. Datasets 2–4 have the cumulative number of failures 2,2,,353; 2,5,,377; 2,5,,495, at t=1,2,,37, respectively.

    Table 3.  Information of datasets.
    Dataset Index Explanation
    1 Months Sum of Bugs and NFs
    2 Months Sum of Bugs and IPMS
    3 Months Sum of NFs and IPMs
    4 Months Sum of total issues (Bugs + NFs + IPMs)

     | Show Table
    DownLoad: CSV

    We estimated the parameters of all models listed in Table 1 for Datasets 1–4 based on the least square estimation method using MATLAB (version 2021a) and R (version 4.2.2) programs; the parameter estimates of model are listed in Table 4. Tables 58 list the criteria obtained using the estimated parameters listed in Table 4; the best value for each criterion is indicated in bold font.

    Table 4.  Parameter estimation of model for Datasets 1–4.
    No. Model Dataset 1 Dataset 2 Dataset 3 Dataset 4
    1 GO ˆa=15579.370ˆb=0.000237 ˆa=30074.804ˆb=0.00016 ˆa=26543.88ˆb=0.00023 ˆa=35704.462ˆb=0.00020
    2 HD-GO ˆa=709.783ˆb=0.005496ˆc=1.27898 ˆa=709.783ˆb=0.00745ˆc=1.5662 ˆa=709.783ˆb=0.00954ˆc=0.7354 ˆa=709.783ˆb=0.01151ˆc=175.9297
    3 Y-DS ˆa=141419.032ˆb=0.001433 ˆa=113361.757ˆb=0.00182 ˆa=92734.061ˆb=0.00223 ˆa=206592.161ˆb=0.00163
    4 O-IS ˆa=265191.291ˆb=0.129382ˆβ=108796.118 ˆa=55395.720ˆb=0.11982ˆβ=13622.8014 ˆa=31054.349ˆb=0.08524ˆβ=1964.09 ˆa=41668.713ˆb=0.10680ˆβ=4506.2851
    5 Y-Exp ˆa=6651.999ˆα=13.4697ˆβ=0.000097ˆγ=0.426491 ˆa=23542.721ˆα=0.2863ˆβ=0.000015ˆγ=48.3835 ˆa=9574.09ˆα=4.3317ˆβ=0.0000081ˆγ=18.2711 ˆa=8894.355ˆα=0.0063ˆβ=0.000229ˆγ=571.5637
    6 Y-Ray ˆa=18930.468ˆα=0.06186ˆβ=0.000004ˆγ=60.355006 ˆa=7937.291ˆα=0.5458ˆβ=0.0000014ˆγ=42.4752 ˆa=5198.476ˆα=1.9516ˆβ=0.0000009ˆγ=48.8568 ˆa=10748.070ˆα=2.4634ˆβ=0.0000163ˆγ=1.2584
    7 PZ-IFD ˆa=1.427ˆb=0.017955ˆd=4.621768 ˆa=1.410ˆb=0.01901ˆd=5.6567 ˆa=4.145ˆb=0.01651ˆd=2.6920 ˆa=3.282ˆb=0.01787ˆd=3.7908
    8 P-DP1 ˆα=125.5344ˆγ=0.03869 ˆα=172.8202ˆγ=0.0374 ˆα=266.7805ˆγ=0.0334 ˆα=261.0303ˆγ=0.0369
    9 P-DP2 ˆα=244.7919ˆγ=0.029573^t0=9.839177^m0=1.5332 ˆα=330.5071ˆγ=0.0288^t0=16.1134^m0=32.0163 ˆα=247.5648ˆγ=0.0346^t0=4.7037^m0=2.7852 ˆα=428.8474ˆγ=0.0301^t0=9.3036^m0=6.5048
    11 P-DP3 ˆa=2613.915ˆb=0.156904ˆβ=8.2482ˆd=285.0215 ˆa=529633.047ˆb=0.13081ˆβ=2.0695ˆd=64815.3057 ˆa=4946.888ˆb=0.10157ˆβ=0.5079ˆd=372.2134 ˆa=69831.344ˆb=0.11404ˆβ=0.1537ˆd=8676.8881
    10 L-DP ˆa=1792.175ˆb=0.00494ˆc=71.7287ˆh=2.2845 ˆa=5034.263ˆb=0.00033ˆc=13.2127ˆh=3.3307 ˆa=1966.294ˆb=0.00152ˆc=30.1387ˆh=9.7228 ˆa=2485.048ˆb=0.00004ˆc=0.8902ˆh=5.8794
    12 New ˆa=87694025.6ˆb=0.1622ˆk=5.1345 ˆa=899987.667ˆb=0.15304ˆk=7.9320 ˆa=1835.516ˆb=0.13584ˆk=17.2829 ˆa=658742.756ˆb=0.14264ˆk=15.3712

     | Show Table
    DownLoad: CSV
    Table 5.  CVs for model comparison on Dataset 1.
    No. Model MSE PRV RMSPE SAE MAE MEOP PRR TS PIC PC R2 Adj R2
    1 GO 1749.0858 39.7658 41.1806 1160.8790 34.1435 33.1680 11.6572 46.0613 59538.9169 128.0236 0.6312 0.6089
    2 HD-GO 1918.5570 41.2864 42.4974 1186.6781 35.9599 34.9023 12.2289 47.5265 63364.8815 126.4751 0.6074 0.5706
    3 Y-DS 606.9791 23.4641 24.2601 650.4427 19.1307 18.5841 459.0569 27.1343 20707.2882 110.0315 0.8720 0.8643
    4 O-IS 36.0128 5.5591 5.8198 165.6282 5.0190 4.8714 119.988 6.5114 1240.9221 60.8801 0.9926 0.9919
    5 Y-Exp 1868.2746 39.9998 41.2932 1157.2915 36.1654 35.0694 11.6917 46.1835 59831.4523 123.0148 0.6293 0.5815
    6 Y-Ray 630.7619 23.1734 23.9915 643.7168 20.1161 19.5066 479.2857 26.8349 20231.0471 105.6413 0.8748 0.8587
    7 PZ-IFD 542.3169 21.8688 22.5922 599.3037 18.1607 17.6266 472.5235 25.2682 17948.9582 105.6277 0.8890 0.8786
    8 P-DP1 454.8300 20.3569 21.0017 550.7308 16.1980 15.7352 1072.91 23.4885 15534.2202 105.1258 0.9041 0.8983
    9 P-DP2 425.5850 19.7243 19.7257 553.6523 17.3016 16.7773 288.4161 22.0424 13665.3862 99.3459 0.9156 0.9047
    10 P-DP3 32.6231 5.3460 5.4582 159.8638 4.9957 4.8444 2.6718 6.1028 1090.6046 58.2508 0.9935 0.9927
    11 L-DP 33.0958 5.4048 5.4982 140.5448 4.3920 4.2589 1.9926 6.1469 1105.7307 58.4809 0.9934 0.9926
    12 New 24.5575 4.8076 4.8118 114.1580 3.4593 3.3576 0.7847 5.3770 862.8971 54.5629 0.9950 0.9945

     | Show Table
    DownLoad: CSV
    Table 6.  CVs for model comparison on Dataset 2.
    No. Model MSE PRV RMSPE SAE MAE MEOP TS PRR PIC PC R2 Adj R2
    1 GO 2908.3079 51.1206 53.1200 1533.2673 43.8076 42.5908 44.0904 13.0524 101862.7752 140.6529 0.6561 0.6359
    2 HD-GO 3288.0496 54.0665 55.6817 1593.5985 46.8705 45.5314 46.2061 13.8233 111847.6852 139.4058 0.6223 0.5880
    3 Y-DS 935.3733 29.0943 30.1279 785.6199 22.4463 21.8228 25.0044 100.3033 32810.0655 120.8012 0.8894 0.8829
    4 O-IS 55.8942 7.0373 7.2595 200.3325 5.8921 5.7238 6.0244 11.7649 1954.4024 70.1378 0.9936 0.9930
    5 Y-Exp 3087.2469 51.2011 53.1445 1531.5532 46.4107 45.0457 44.1096 13.0542 101927.1487 135.0539 0.6558 0.6128
    6 Y-Ray 973.7958 28.7239 29.8466 780.6954 23.6574 22.9616 24.7731 104.5938 32183.2611 116.0157 0.8914 0.8779
    7 PZ-IFD 813.8860 26.6544 27.6965 711.3360 20.9216 20.3239 22.9885 110.3514 27726.1230 115.6699 0.9065 0.8980
    8 P-DP1 676.7092 24.7943 25.6270 639.2695 18.2648 17.7575 21.2679 244.5784 23756.8221 115.1364 0.9200 0.9153
    9 P-DP2 626.2336 23.9577 23.9592 653.5447 19.8044 19.2219 19.8662 239.2390 20713.7086 108.7313 0.9302 0.9215
    10 P-DP3 46.1444 6.4682 6.5028 202.5889 6.1391 5.9585 5.3927 3.7242 1570.7650 65.7002 0.9949 0.9942
    11 L-DP 53.8884 6.9832 7.0271 193.2495 5.8560 5.6838 5.8277 1.6682 1826.3172 68.2600 0.9940 0.9932
    12 New 41.6728 6.2699 6.2735 192.7933 5.6704 5.5084 5.2018 3.3775 1470.8747 65.1464 0.9952 0.9948

     | Show Table
    DownLoad: CSV
    Table 7.  CVs for model comparison on Dataset 3.
    No. Model MSE PRV RMSPE SAE MAE MEOP TS PRR PIC PC R2 Adj R2
    1 GO 2287.4481 44.9701 47.1005 1377.519 39.3577 38.2644 33.0486 8.4481 80132.683 136.4505 0.7719 0.7584
    2 HD-GO 2788.2933 49.6130 51.2713 1478.073 43.4727 42.2306 35.9627 9.3023 94855.972 136.6031 0.7298 0.7053
    3 Y-DS 388.0583 19.1464 19.4162 468.6592 13.3903 13.0183 13.6121 91.6956 13654.041 105.4049 0.9613 0.9590
    4 O-IS 99.0515 9.6336 9.6710 238.4523 7.0133 6.8129 6.7782 1.8966 3421.7495 79.8649 0.9904 0.9895
    5 Y-Exp 2445.8270 45.1553 47.2919 1383.307 41.9184 40.6855 33.1829 8.4914 80760.2899 131.2112 0.7700 0.7412
    6 Y-Ray 408.4608 19.1300 19.3441 461.4523 13.9834 13.5721 13.5605 97.1207 13527.2073 101.6804 0.9616 0.9568
    7 PZ-IFD 311.0582 17.0022 17.1362 388.9742 11.4404 11.1135 12.0117 84.0768 10629.9796 99.3187 0.9699 0.9671
    8 P-DP1 246.5689 15.4693 15.4825 355.2497 10.1500 9.8680 10.8504 229.1409 8701.9111 97.4684 0.9754 0.9740
    9 P-DP2 261.0926 15.4687 15.4704 363.6438 11.0195 10.6954 10.8417 760.0981 8664.0564 94.2963 0.9754 0.9724
    10 P-DP3 124.6118 10.5118 10.6830 327.8676 9.9354 9.6432 7.4900 3.2155 4160.1880 82.0917 0.9883 0.9868
    11 L-DP 119.1020 10.4128 10.4478 296.8038 8.9941 8.7295 7.3225 2.3600 3978.3649 81.3455 0.9888 0.9874
    12 New 141.9586 11.4880 11.5765 358.5639 10.5460 10.2447 8.1145 3.5573 4880.5910 85.9831 0.9862 0.9850

     | Show Table
    DownLoad: CSV
    Table 8.  CVs for model comparison on Dataset 4.
    No. Model MSE PRV RMSPE SAE MAE MEOP TS PRR PIC PC R2 Adj R2
    1 GO 5149.9542 67.9784 70.6857 2052.4628 58.6418 57.0129 40.3687 11.0273 180320.3972 150.6527 0.6949 0.6770
    2 HD-GO 6215.2439 74.6340 76.5627 2184.1801 64.2406 62.4051 43.7097 12.1963 211372.2939 150.2299 0.6424 0.6099
    3 Y-DS 1383.9061 35.5586 36.6507 964.0537 27.5444 26.7793 20.9265 60.6451 48508.7130 127.6563 0.9180 0.9132
    4 O-IS 133.4095 11.0178 11.2193 293.6791 8.6376 8.3908 6.4039 6.0626 4589.9226 84.9272 0.9923 0.9916
    5 Y-Exp 5531.7658 68.3112 71.1327 2071.6176 62.7763 60.9299 40.6255 11.1302 182596.2704 144.6772 0.6911 0.6524
    6 Y-Ray 1461.7003 35.3994 36.5725 964.3966 29.2241 28.3646 20.8831 62.4636 48284.1104 122.7172 0.9184 0.9082
    7 PZ-IFD 1183.7263 32.5196 33.4115 854.8952 25.1440 24.4256 19.0754 62.6249 40300.6951 122.0382 0.9319 0.9257
    8 P-DP1 956.5578 29.8019 30.4771 748.3795 21.3823 20.7883 17.3980 153.2968 33551.5228 121.1931 0.9433 0.9400
    9 P-DP2 927.9433 29.1631 29.1652 770.7883 23.3572 22.6702 16.6390 197.9840 30670.1293 115.2199 0.9482 0.9417
    10 P-DP3 114.1997 10.2304 10.2314 268.6371 8.1405 7.9011 5.8371 1.6640 3816.5911 80.6520 0.9936 0.9928
    11 L-DP 158.4102 11.9760 12.0483 299.3494 9.0712 8.8044 6.8748 1.1627 5275.5382 86.0515 0.9912 0.9900
    12 New 115.5631 10.3995 10.4459 305.9183 8.9976 8.7405 5.9602 3.0198 3983.1460 82.4859 0.9934 0.9927

     | Show Table
    DownLoad: CSV

    In Table 5, we can observe that the MSE, PRV, RMSE, SAE, MAE, MEOP, TS, PRR, PIC and PC values for the proposed model were the lowest, and that the R2 and Adj R2 values for the proposed model were the largest among all models. As listed in Table 5, the values of MSE, PRV, RMSE, SAE, MAE, MEOP, TS, PRR, PIC and PC for the proposed model were 24.5575, 4.8076, 4.8118,114.1580, 3.4593, 3.3576, 0.7847, 5.3770,862.8971 and 54.5629, respectively, which are lower. The proposed models for the values of R2 and Adj R2 were 0.9950 and 0.9945, respectively, which are higher. Next, the P-DP3 model's MSE, PRV, RMSE, TS, PIC and PC values were 32.6231, 5.3460, 5.4582, 6.1028, 1090.6046 and 58.2508, respectively, which are the second lowest. Moreover, the P-DP3 model's values of R2 and Adj R2 were 0.9935 and 0.9927, respectively, which are the second largest. The SAE, MAE, MEOP and PRR values for the L-DP model were 140.5448, 4.3920, 4.2589 and 1.9926, respectively, which are the second lowest. Figure 1 depicts graphical representations of the MVFs for all models based on Dataset 1. Figure 2 depicts the graphical representation of the relative error values (REVs) of all models for Dataset 1. It is evident that the proposed model is closer to zero at each point of time index compared to other models.

    Figure 1.  MVFs of the 12 models for Dataset 1.
    Figure 2.  REVs of the 12 models for Dataset 1.

    In Table 6, we can observe that the MSE, PRV, RMSE, SAE, MAE, MEOP, TS, PIC and PC values for the proposed model are the lowest, and that the R2 and Adj R2 values for the proposed model are the largest among all the models compared. As listed in Table 6, the values of MSE, PRV, RMSE, SAE, MAE, MEOP, TS, PIC and PC for the proposed model were 41.6728, 6.2699, 6.2735,192.7933, 5.6704, 5.5084, 5.2018, 1470.8747 and 65.1464, respectively, which are lower. The proposed model's values of R2 and Adj R2 were 0.9952 and 0.9948, respectively, which are higher. The PRR value for the L-DP model was 1.6682, which is the lowest. Next, the P-DP3 model's values of MSE, PRV, RMSE, TS, PIC and PC were 46.1444, 6.4682, 6.5028, 5.3927, 1570.7650 and 65.7002, respectively, which are the second lowest. Furthermore, the P-DP3 model's values of R2 and Adj R2 were 0.9949 and 0.9942, respectively, which are the second largest. The SAE, MAE and MEOP values for the L-DP model were 192.7933, 5.8560 and 5.6838, respectively, which are the second lowest. Figure 3 depicts graphical representations of the MVFs for all models based on Dataset 2. Figure 4 depicts the graphical representation of the REVs for all models for Dataset 2.

    Figure 3.  MVFs of the 12 models for Dataset 2.
    Figure 4.  REVs of the 12 models for Dataset 2.

    In Table 7, we can observe that the MSE, PRV, RMSE, TS, PRR, PIC and PC values for the proposed model were the fourth lowest, and that the values of SAE, MAE and MEOP for the proposed model were the fifth lowest when compared to those of the other models. The R2 and Adj R2 values for the proposed model were the fourth largest among all of the models compared. As listed in Table 7, the values of MSE, PRV, RMSE, SAE, MAE, MEOP, TS, PRR, PIC and PC for the proposed model were 141.9586, 11.4880, 11.5765,358.5639, 10.5460, 10.2447, 8.1145, 3.5573, 4880.5910 and 85.9831, respectively. The values of R2 and Adj R2 for the proposed model were 0.9862 and 0.9850, respectively. The values of MSE, PRV, RMSE, SAE, MAE, MEOP, TS, PRR, PIC and PC for the O-IS model were 99.0515, 9.6336, 9.6710,238.4523, 7.0133, 6.8129, 6.7782, 1.8966, 3421.7495 and 79.8649, respectively, which are the lowest. In addition, the values of R2 and Adj R2 for the O-IS model were 0.9904 and 0.9895, respectively, which are the largest. The values of MSE, PRV, RMSE, SAE, MAE, MEOP, TS, PRR, PIC and PC for the L-DP model were 119.1020, 10.4128, 10.4478,296.8038, 8.9941, 8.7295, 7.3225, 2.3600, 3978.3649 and 81.3455, respectively, which are the second lowest. The values of R2 and Adj R2 for the L-DP model were 0.9888 and 0.9874, respectively, which are the second largest.

    Figure 5 depicts graphical representations of the MVFs for all models based on Dataset 3. Figure 6 depicts the graphical representation of the REVs of all models for Dataset 3.

    Figure 5.  MVFs of the 12 models for Dataset 3.
    Figure 6.  REVs of 12 models for Dataset 3.

    In Table 8, we can observe that the MSE, PRV, RMSE, TS, PIC and PC values for the proposed model were the second lowest among all of the models compared. The values of MAE, MEOP and PRR for the proposed model were the third lowest when compared to other models. The R2 and Adj R2 values for the proposed model were the second largest among all of the models compared. As listed in Table 8, the values of MSE, PRV, RMSE, TS, PIC and PC for the proposed model were 115.5631, 10.3995, 10.4459, 5.9602, 3983.1460 and 82.4859, respectively, which are the second lowest. The MAE, MEOP and PRR values for the proposed model were 8.9976, 8.7405 and 3.0198, respectively, which are the third lowest. The values of R2 and Adj R2 for the proposed model were 0.9934 and 0.99927, respectively, which are the second largest values. The values of MSE, PRV, RMSE, SAE, MAE, MEOP, TS, PIC and PC for the P-DP3 model were 114.1997, 10.2304, 10.2314,268.6371, 8.1405, 7.9011, 5.8371, 3816.5911 and 80.6520, respectively, which are the lowest.

    Furthermore, the values of R2 and Adj R2 for the P-DP3 model were 0.9936 and 0.9928, respectively, which are the largest. The SAE, MAE and MEOP values for the O-IS model were 293.6791, 8.6376 and 8.3908, respectively, which are the second lowest. The goodness-of-fit of the proposed model was excellent when considering the values of the overall criteria. Figure 7 depicts graphical representations of the MVFs for all models based on Dataset 4. Figure 8 depicts the graphical representation of the REVs of all models for Dataset 4.

    Figure 7.  MVFs of all 12 models for Dataset 4.
    Figure 8.  REVs of 12 models for Dataset 4.

    In Table 9, we can observe that the AC values for the proposed model on Datasets 1–2 were the lowest among all of the models that were compared. The AC value for the proposed model on Dataset 3 was the fourth lowest. In addition, the AC value for the proposed model on Dataset 4 was the second lowest. For Dataset 3, the AC value for the O-IS model was the lowest. For Dataset 4, the AC value for the P-DP3 model was the lowest. From the AC values, it is evident that the goodness-of-fit of the proposed model is excellent. Figure 9 depicts the graphical representation of the three-dimensional plots for the model, AC values and ranks of the 12 models listed in Table 9 for Datasets 1–4.

    Table 9.  AC values for model comparison on Datasets 1–4.
    No. Model Dataset 1 Dataset 2 Dataset 3 Dataset 4
    1 GO 0.14288 0.14586 0.15089 0.14702
    2 HD-GO 0.15684 0.16297 0.17542 0.16900
    3 Y-DS 0.10143 0.09779 0.08547 0.09339
    4 O-IS 0.03764 0.03318 0.01930 0.02850
    5 Y-Exp 0.14963 0.15136 0.15869 0.15445
    6 Y-Ray 0.10133 0.09713 0.08474 0.09400
    7 PZ-IFD 0.08942 0.08613 0.07121 0.08188
    8 P-DP1 0.08810 0.08270 0.06424 0.07774
    9 P-DP2 0.07100 0.07817 0.08379 0.07844
    10 P-DP3 0.02331 0.02485 0.03470 0.01621
    11 L-DP 0.02513 0.02500 0.02752 0.03406
    12 New 0.01329 0.01488 0.04402 0.02532

     | Show Table
    DownLoad: CSV
    Figure 9.  Three-dimensional plots of the model, AC values and ranks of 12 models listed in Table 9 for Dataset 1–4.

    In this section, we present a sensitivity analysis (SA) to examine the effect of each parameter of the proposed model on software reliability. We analyzed how the software reliability values change when each estimated parameter value from Datasets 1 to 4 changes by 5% from -15% to +15% using Equation (2). Figures 10 depicts the SA for three parameters (a, b, k) in the proposed model based on Dataset 1. As depicted in Figure 10, the estimated software reliability values can be viewed according to each estimated parameter. Parameter a shows that it does not significantly affect the reliability. Parameter b has a greater influence than the other parameters, and it is determined that parameter k also has a slight effect. As can be seen in Figures 1113, the results of the SA of the reliability are similar.

    Figure 10.  SA of the reliability of the proposed model on Dataset 1.
    Figure 11.  SA of the reliability of the proposed model on Dataset 2.
    Figure 12.  SA of the reliability of the proposed model on Dataset 3.
    Figure 13.  SA of the reliability of the proposed model on Dataset 4.

    In the era of the fourth industrial revolution, since most core technologies are implemented in software, it is very important to reduce the possibility of software failure and maintain a high level of reliability. Many large companies are performing their own OSS developments, and the development process for OSS is primarily because users find software defects during the usage process and communicate them to the developer, who checks and removes them. We discussed a new SRM that considers the number of finite faults and dependent faults, and we examined the goodness-of-fit based on several criteria by using OSS datasets to show that the new SRM is superior to existing models. Since it is difficult to select the first criterion to confirm the performance excellence of the SRM due to the variety of comparison criteria, we proposed a new integrated criterion considering the value and ranking of each criterion, and the results also demonstrated that the proposed model is superior to other models. In addition, SA was conducted by using the amount of change in each parameter to determine the extent to which the parameter affects software reliability, and it was found that the parameter b had a greater effect than other parameters.

    This research was supported by the Basic Science Research Program through the National Research Foundation (NRF) of Korea, funded by the Ministry of Education (NRF-2021R1F1A1048592 and NRF-2021R1I1A1A01059842).

    The authors declare that there is no conflict of interest.

    [1] Granqvist CG (2007) Transparent Conductors as Solar Energy Materials: A Panoramic Review. Sol Energ Mat Sol C 91: 1529–1598. doi: 10.1016/j.solmat.2007.04.031
    [2] Granqvist CG (2003) Solar Energy Materials. Adv Mater 15: 1789–1803. doi: 10.1002/adma.200300378
    [3] Girtan M (2005) Investigations on the Optical Constants of Indium Oxide Thin Films Prepared by Ultrasonic Spray Pyrolysis. Mater Sci Eng B 118: 175–178. doi: 10.1016/j.mseb.2004.12.075
    [4] Girtan M, Folcher G (2003) Structural and optical properties of indium oxide thin films prepared by an ultrasonic spray CVD process. Surf Coat Tech 172: 242–250. doi: 10.1016/S0257-8972(03)00334-7
    [5] Girtan M, Rusu GI, Rusu GG (2000) The influence of preparation conditions on the electrical and optical properties of oxidized indium thin films. Mater Sci Eng B 76: 156–160. doi: 10.1016/S0921-5107(00)00439-6
    [6] Rusu M, Rusu GG, Girtan M, et al. (2008) Structural and optical properties of ZnO thin films deposited onto ITO/glass substrates. J Non-Cryst Solids 354: 4461–4464. doi: 10.1016/j.jnoncrysol.2008.06.070
    [7] Girtan M, Bouteville A, Rusu GG, et al. (2006) Preparation and properties of SnO2 :F thin films. J Optoelectron Adv M 8: 27–30.
    [8] Girtan M, Vlad A, Mallet R, et al. (2013) On the properties of aluminium doped zinc oxide thin films deposited on plastic substrates from ceramic targets. Appl Surf Sci 274: 306–313. doi: 10.1016/j.apsusc.2013.03.046
    [9] Girtan M, Kompitsas M, Mallet R, et al. (2010) On physical properties of undoped and Al and In doped zinc oxide films deposited on PET substrates by reactive pulsed laser deposition. Eur Phys J Appl Phys 51.
    [10] Ghomrani FZ, Iftimie S, Gabouze N, et al. (2011) Influence of Al doping agents nature on the physical properties of Al:ZnO films deposited by spin-coating technique. Optoelectron Adv Mat 5: 247–251.
    [11] Socol M, Preda N, Rasoga O, et al. (2016) Flexible Heterostructures Based on Metal Phthalocyanines Thin Films Obtained by MAPLE. Appl Surf Sci 374: 403–410. doi: 10.1016/j.apsusc.2015.10.166
    [12] Girtan M, Mallet R, Caillou D, et al. (2009) Thermal Stability of Poly(3,4-ethylenedioxythiophene)-polystyrenesulfonic Acid Films Electric Properties. Superlattice Microst 46: 44–51. doi: 10.1016/j.spmi.2008.10.010
    [13] Koralli P, Varol SF, Kompitsas M, et al. (2016) Brightness of Blue/Violet Luminescent Nano-Crystalline AZO and IZO Thin Films with Effect of Layer Number: For High Optical Performance. Chinese Phys Lett 33.
    [14] Iftimie S, Mallet R, Merigeon J, et al. (2015) On the structural, morphological and optical properties of ITO, ZnO, ZnO:Al and NiO thin films obtained by thermal oxidation. Dig J Nanomater Bios 10: 221–229.
    [15] Gong L, Lu JG, Ye ZZ (2011) Transparent conductive Ga-doped ZnO/Cu multilayers prepared on polymer substrates at room temperature. Sol Energ Mat Sol C 95: 1826–1830. doi: 10.1016/j.solmat.2011.02.004
    [16] Girtan M, Mallet R (2014) On the electrical properties of transparent electrodes. Proceedings of the Romanian Academy Series A-Mathematics Physics Technical Sciences Information Science, 15: 146–150.
    [17] Girtan M (2012) Comparison of ITO/metal/ITO and ZnO/metal/ZnO Characteristics as Transparent Electrodes for Third Generation Solar Cells. Sol Energ Mater Sol C 100: 153–161. doi: 10.1016/j.solmat.2012.01.007
    [18] Kubis P, Lucera L, Machui F, et al. (2014) High Precision Processing of Flexible P3HT/PCBM Modules with Geometric Fill Factor over 95%. Org Electron 15: 2256–2263. doi: 10.1016/j.orgel.2014.06.006
    [19] Berny S, Blouin N, Distler A, et al. (2016) Solar Trees: First Large-Scale Demonstration of Fully Solution Coated, Semitransparent, Flexible Organic Photovoltaic Modules. Adv Sci 3.
    [20] Wanga K, Chenga B, Wub B, et al. (2014) Study of annealing effects upon the optical and electrical properties of SnO2:F/SiCxOy low emissivity coatings by spectroscopic ellipsometry. Thin Solid Films 571: 720–726. doi: 10.1016/j.tsf.2013.11.029
    [21] Yuan G, Wang K, Li M, et al. (2016) In situ optical characterizations of the annealing effects upon SnO2:F films by spectroscopic ellipsometry. Mater Res Express 3: 105048. doi: 10.1088/2053-1591/3/10/105048
    [22] Girtan M, Socol M, Pattier B, et al. (2010) On the structural, morphological, optical and electrical properties of sol-gel deposited ZnO In films. Thin Solid Films 519: 573–577. doi: 10.1016/j.tsf.2010.07.006
    [23] Rusu GG, Girtan M, Rusu M (2007) Preparation and characterization of ZnO thin films prepared by thermal oxidation of evaporated Zn thin films. Superlattice Microst 42: 116–122. doi: 10.1016/j.spmi.2007.04.021
    [24] Fortunato E, Nunes P, Marques A, et al. (2002) Transparent, conductive ZnO:Al thin film deposited on polymer substrates by RF magnetron sputtering. Surf Coat Tech 151: 247–251.
    [25] Craciun V, Amirhaghi S, Craciun D, et al. (1995) Effects of laser wavelength and fluence on the growth of ZnO thin-films by pulsed-laser deposition. Appl Surf Sci 86: 99–106. doi: 10.1016/0169-4332(94)00405-6
    [26] Kim H, Horwitz JS, Kim WH, et al. (2002) Doped ZnO thin films as anode materials for organic light-emitting diodes. Thin Solid Films 420: 539–543.
    [27] Liu Y, Zhao L, Lian J (2006) Al-doped ZnO films by pulsed laser deposition at room temperature. Vacuum 81: 18–21. doi: 10.1016/j.vacuum.2006.02.001
    [28] Manole AV, Dobromir M, Girtan M, et al. (2013) Optical Properties of Nb-doped TiO2 Thin Films Prepared by Sol-gel Method. Ceram Int 39: 4771–4776. doi: 10.1016/j.ceramint.2012.11.066
    [29] Saidi W, Hfaidh N, Rashed M, et al. (2016) Effect of B2O3 Addition on Optical and Structural Properties of TiO2 as a New Blocking Layer for Multiple Dye Sensitive Solar Cell Application (DSSC). RSC Adv 6: 68819–68826. doi: 10.1039/C6RA15060H
    [30] Mardare D, Iacomi F, Cornei N, et al. (2010) Undoped and Cr-doped TiO2 thin films obtained by spray pyrolysis. Thin Solid Films 518: 4586–4589. doi: 10.1016/j.tsf.2009.12.037
    [31] Vaiciulis I, Girtan M, Stanculescu A, et al. (2012) On titanium oxide spray deposited thin films for solar cells applications. Proceedings of the Romanian Academy Series A-Mathematics Physics Technical Sciences Information Science, 13: 335–342.
    [32] Mardare D, Yildiz A, Girtan M, et al. (2012) Surface wettability of titania thin films with increasing Nb content. J Appl Phys 112.
    [33] Pattier B, Henderson M, Kassiba A, et al. (2009) EPR and SAXS studies of a TiO2-based gel. 3rd ICTON Mediterranean Winter Conference, Angers, France.
    [34] Green MA, HO-Baillie A, Snaith HJ (2014) The emergence of perovskite solar cells. Nat Photonics 8: 506–514. doi: 10.1038/nphoton.2014.134
    [35] Hagfeldt A, Cappel UB, Boschloo G, et al. (2012) Mesoporous Dye-Sensitized Solar Cells, Elsevier, 481–496.
    [36] Nazeeruddin MK, Grätzel M (2004) Conversion and Storage of Solar Energy using Dye-sensitized Nanocrystalline TiO2 Cells, Pergamon, Comprehensive Coordination Chemistry II, 9: 719–758
    [37] Millington KR (2009) Photoelectrochemical cells|Dye-Sensitized Cells, Encyclopedia of Electrochemical Power Sources, 10–21.
    [38] Burschka J, et al. (2013) Sequential deposition as a route to high-performance perovskite-sensitized solar cells. Nature 499: 316–319. doi: 10.1038/nature12340
    [39] Lee MM, Teuscher J, Miyasaka T, et al. (2012) Efficient hybrid solar cells based on meso-superstructured organometal halide perovskites. Science 338: 643–647. doi: 10.1126/science.1228604
    [40] Lewis NS (2004) Photosynthesis, Artificial, Encyclopedia of Energy, 17–24.
    [41] Pandit A, Frese RN (2012) Artificial Leaves: Towards Bio-Inspired Solar Energy Converters, In: Sayigh A, Comprehensive Renewable Energy, Elsevier, 657–677.
    [42] Rusu GI, Leontie L, Rusu GG, et al. (1999) On the electronic transport properties of oxidized bismuth thin films. Analele Stiintifice Ale Universitatii Al. I. Cuza Din Iasi Fizica Stării Condensate 104–112.
    [43] Fruth V, Popa M, Berger D, et al. (2005) Deposition and characterisation of bismuth oxide thin films. J Eur Ceram Soc 25: 2171–2174. doi: 10.1016/j.jeurceramsoc.2005.03.025
    [44] Tompkins HG, McGahan AW (1999) Spectroscopic Ellipsometry and Reflectometry: A user's guide, New York: Wiley.
    [45] Bhattacharyya D, Sahoo NK, Thakur S, et al. (2000) Spectroscopic ellipsometry of TiO2 layers prepared by ion-assisted electron-beam evaporation. Thin Solid Films 360: 96–102. doi: 10.1016/S0040-6090(99)00966-9
    [46] Bernoux Fran F, Piel JP, Castellon B, et al. (2003) Ellipsométrie. Théorie. Techniques de l'ingénieur. Mesures et contrôle RD3: R6490.1–R6490.11.
    [47] Abeles F (1967) Advanced Optical Techniques, North-Holland, Amsterdam, 145.
    [48] Heavens OS (1955) Optical Properties of Thin Solid Films, London: Butter worth.
    [49] Hartnagel HL, Dawar AL, Jain AK, et al. (1995) Semiconducting Transparent Thin Films, Bristol: Institute of Physics.
    [50] Fujiwara H (2007) Spectroscopic Ellipsometry: Principles and Applications, New York: Wiley.
    [51] Horiba Delta Psi2 Software.
    [52] D'Elia S, Scaramuzza N, Ciuchi F. et al. (2009) Ellipsometry investigation of the effects of annealing temperature on the optical properties of indium tin oxide thin films studied by Drude–Lorentz model. Appl Surf Sci 255: 7203–7211. doi: 10.1016/j.apsusc.2009.03.064
    [53] Bellingham JR, Phillips WA, Adkins CJ (1991) Amorphous Indium Oxide. Thin Solid Films 202: 23–31.
    [54] Torres-Huerta M, Domínguez-Crespo MA, Brachetti-Sibaja SB, et al. (2011) Effect of the substrate on the properties of ZnO–MgO thin films grown by atmospheric pressure metal-organic chemical vapor deposition. Thin Solid Films 519: 6044–6052. doi: 10.1016/j.tsf.2011.03.030
    [55] Forouhi AR, Bloomer I (1986) Optical dispersion relations for amorphous semiconductors and amorphous dielectrics. Phys Rev B 34: 7018. doi: 10.1103/PhysRevB.34.7018
    [56] Kim JK, Gessmann T, Schubert EF, et al. (2006) GaInN light-emitting diode with conductive omnidirectional reflector having a low refractive-index indium-tin oxide layer. Appl Phys Lett 88: 013501. doi: 10.1063/1.2159097
    [57] Wang YC, Lin BY, Liu PT, et al. (2013) Photovoltaic electrical properties of aqueous grown ZnO antireflective nanostructure on Cu(In, Ga)Se2 thin film solar cells. Opt Express 22: A13–A20.
    [58] Mardare D, Hones P (1999) Optical dispersion analysis of TiO2 thin films based onvariable-angle spectroscopic ellipsometry measurements. Mater Sci Eng B 68: 42–47.
    [59] Condurache-Bota S, Tigau N, Rambu AP, et al. (2011) Optical and electrical properties of thermally oxidized bismuth thin films. Appl Surf Sci 257: 10545–10550.
    [60] Eiamchai P, Chindaudom P, Pokaipisit A, et al. (2009) A spectroscopic ellipsometry study of TiO2 thin films prepared by ion-assisted electron-beam evaporation. Curr Appl Phys 9: 707–712. doi: 10.1016/j.cap.2008.06.011
    [61] Leontie L, Caraman M, Visinoiu A, et al. (2005) On the optical properties of bismuth oxide thin films prepared by pulsed laser deposition. Thin Solid Films 473: 230–235. doi: 10.1016/j.tsf.2004.07.061
    [62] Sun HT, Wang XP, Kou ZQ, et al. (2015) Optimization of TiO2/Cu/TiO2 multilayers as a transparent composite electrode deposited by electron-beam evaporation at room temperature. Chinese Phys B 24: 047701. doi: 10.1088/1674-1056/24/4/047701
    [63] Bube RH (1974) Electronic Properties of Crystalline Solids, New York: Academic Press.
  • Reader Comments
  • © 2017 the Author(s), licensee AIMS Press. This is an open access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0)
通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

  1. 本站搜索
  2. 百度学术搜索
  3. 万方数据库搜索
  4. CNKI搜索

Metrics

Article views(7830) PDF downloads(1420) Cited by(18)

/

DownLoad:  Full-Size Img  PowerPoint
Return
Return

Catalog