A comprehensive study of a class of Oxide/Metal/Oxide (Oxide = ITO, AZO, TiO2 and Bi2O3, Metal = Au) thin films was done by correlating the spectrophotometric studies with the ellispometric models. Films were deposited by successive sputtering from metallic targets In:Sn, Zn:Al, Ti and Bi in reactive atmosphere (for the oxide films) and respective inert atmosphere (for the metallic Au interlayer films) on glass substrates. The measurements of optical constants n—the refractive index and k—the extinction coefficient, at different incident photon energies for single oxide films and also for the three layers films oxide/metal/oxide samples were made using the spectroscopic ellipsometry (SE) technique. The ellipsometry modelling process was coupled with the recorded transmission spectra data of a double beam spectrophotometer and the best fitting parameters were obtained not only by fitting the n and k experimental data with the dispersion fitting curves as usual is practiced in the most reported data in literature, but also by comparing the calculated the transmission coefficient from ellipsometry with the experimental values obtained from direct spectrophotometry measurements. In this way the best dispersion model was deduced for each sample. Very good correlations were obtained for the other different thin films characteristics such as the films thickness, optical band gap and electrical resistivity obtained by other measurements and calculation techniques. The ellipsometric modelling, can hence give the possibility in the future to predict, by ellipsometric simulations, the proper device architecture in function of the preferred optical and electrical properties.
Citation: Mihaela Girtan, Laura Hrostea, Mihaela Boclinca, Beatrice Negulescu. Study of oxide/metal/oxide thin films for transparent electronics and solar cells applications by spectroscopic ellipsometry[J]. AIMS Materials Science, 2017, 4(3): 594-613. doi: 10.3934/matersci.2017.3.594
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Abstract
A comprehensive study of a class of Oxide/Metal/Oxide (Oxide = ITO, AZO, TiO2 and Bi2O3, Metal = Au) thin films was done by correlating the spectrophotometric studies with the ellispometric models. Films were deposited by successive sputtering from metallic targets In:Sn, Zn:Al, Ti and Bi in reactive atmosphere (for the oxide films) and respective inert atmosphere (for the metallic Au interlayer films) on glass substrates. The measurements of optical constants n—the refractive index and k—the extinction coefficient, at different incident photon energies for single oxide films and also for the three layers films oxide/metal/oxide samples were made using the spectroscopic ellipsometry (SE) technique. The ellipsometry modelling process was coupled with the recorded transmission spectra data of a double beam spectrophotometer and the best fitting parameters were obtained not only by fitting the n and k experimental data with the dispersion fitting curves as usual is practiced in the most reported data in literature, but also by comparing the calculated the transmission coefficient from ellipsometry with the experimental values obtained from direct spectrophotometry measurements. In this way the best dispersion model was deduced for each sample. Very good correlations were obtained for the other different thin films characteristics such as the films thickness, optical band gap and electrical resistivity obtained by other measurements and calculation techniques. The ellipsometric modelling, can hence give the possibility in the future to predict, by ellipsometric simulations, the proper device architecture in function of the preferred optical and electrical properties.
1.
Introduction
In recent years, the software industry has expanded significantly owing to the increase in demand for software products for non-face-to-face services for various applications (conferences, education, delivery, shopping, etc.). The development and growth of software industries have led to digital innovation, which has increased the use of technology for both work and leisure [1,2,3,4]. For example, let us consider a store where more than 70% of the daily sales occur via card payments. If the card payment machine does not work due to internet failure, the delivery applications will not receive any processing applications, further affecting the sales severely. Internet failures can occur for various reasons, but users using the software will feel very uncomfortable. Like this, software has become an integral part of our lives. Various software programs are used in different industries, and it is difficult and complicated to develop related software. However, the main focus of software development must be to provide high-quality services to customers by improving reliability and stability.
Various methods are being used to improve software reliability. Among them, software testing is the most widely used method, and software testing is one of the methods to increase software reliability through a series of procedures (code, algorithm, optimization, etc.) to find and improve software faults [5,6]. In the past, software testing was defined as an activity of finding faults to confirm faults in order to check whether an application program or system operates normally and was nothing more than a business activity performed after development. However, in recent years, it refers to the entire process of making decisions through numerical data based on detected faults, such as the early stage of software development and the correction stage. As such, the number of software faults and the time interval between each fault have a significant impact on software reliability, and software reliability can be evaluated more easily by using a software reliability model, i.e., a mathematical model using the number of software faults and the time interval between faults. It can measure the number of software failures, software failure interval and software reliability. Also, as seen in the previous example for internet failure, software faults can occur for a number of reasons, including independent software faults such as code errors and software freezes, and dependent (secondary) causes that lead to other software faults due to code errors.
Many software reliability models (SRMs) have been developed from the past to the present, among the existing SRMs, the Goel-Okumoto (GO) [7] model is the most preferred model, which is based on the non-homogeneous Poisson process (NHPP). The GO model defines a mean value function (MVF) with an intensity function using an exponential distribution. In this model, the reliability during the mission time is determined by estimating the number of failures that occur while removing the faults remaining in the software. Since then, several researchers have extended the SRM based on the NHPP by, for example, indicating that the cumulative failure number of software failures increases in an S-shape by considering testing efforts or assuming imperfect debugging [8]. Pham and Zhang [9] proposed a generalized NHPP SRM in which the basic assumption is that the rate of change in the number of software faults is proportional to the content of the remaining faults. However, because the developed software has a very complex structure, one failure may affect other failures and thus increase the probability of causing another failure, causing software failures to occur dependently [10]. Pham and Pham [11] proposed an SRM with a dependency relationship assuming incomplete debugging. Lee et al. [12] proposed an SRM whereby dependent faults would be caused by prior software failures, and Kim et al. [13] proposed an SRM whereby software failures occur in a dependent manner. The previously proposed SRMs considered that, even if dependent faults occur, they occur constantly.
In recent decades, open-source software (OSS) development has been recognized and accepted by the industry and has gradually become an alternative name for software development. Many large companies, such as Microsoft, Google, Baidu and Alibaba, have their own OSS development projects. The development process for this type of software mainly involves the release of new versions of software or open-source projects by software developers, which enables the users to use and test the software to detect any faults in it during the usage process. The detected faults can be either removed by the users or sent to developers via email so that the developers can verify and remove such failures. Moreover, the effective evaluation of the reliability of OSS is a challenging problem. Various SRMs that utilize OSS have been developed. A reliability model used for effectively evaluating the reliability of OSS [14], a multi-release OSS reliability model with dependent fault detection [15], an OSS reliability growth model that considers change points [16] and an integrated OSS reliability model [17] have been used to evaluate the OSS in various ways.
In this study, when most software-dependent failures occur, dependent defects are considered on the assumption that the probability of rapidly increasing failures increases from the beginning, and, thereafter, the finite number of defects that result in failures occurs at a slow rate until the maximum number of failures is reached. Based on this, we propose a new SRM. In other words, we propose a new SRM that considers the number of finite and dependent defects. In addition, in order to see that the proposed SRM using defect data from OSS, which is a recent trend, is superior to the existing SRMs, the suitability is reviewed based on various criteria.
The MVF for the new SRM is derived in Section 2 by using the maximum number of fault contents in the software and the time-dependent fault detection rate function. The criteria for model comparisons and the selection of the best model are discussed in Section 3, and the results of each criteria value (CV) and model comparison are discussed in Section 4. Finally, in Section 5, conclusions and remarks are presented.
2.
Dependent SRM
2.1. Generalized SRM of existing research
By assuming that software failure follows the NHPP, N(t) (t≥0) is the Poisson probability density function with the parameter m(t), where m(t) is the MVF, which is the expected number of faults detected at time t, and it can be expressed as follows:
Pr{N(t)=n}={m(t)}nn!exp{−m(t)},n=0,1,2,3….
The MVF m(t) with the failure intensity λ(t) is expressed as follows:
m(t)=∫t0λ(s)ds
The reliability function R(t) of software representing the probability that a software error will not occur within the interval [0, t] is expressed as in Equation (1):
R(t)=e−m(t)=e−∫t0λ(s)ds
(1)
If t+x is given, then the software reliability can be expressed as a conditional probability R(x|t), as expressed in Equation (2).
R(x|t)=e−[m(t+x)−m(t)]
(2)
The MVF m(t) of the generalized NHPP SRM can be obtained by solving the differential equation expressed in Equation (3):
dm(t)dt=b(t)[a(t)−m(t)]
(3)
where a(t) is the expected total number of software failures, and b(t) is the fault detection rate function. Many existing NHPP SRMs have been developed on the premise that software faults occur independently (remove faults immediately if they occur). However, since the software is used in different environments, software faults occur very differently, depending on where the software is operated, and new faults may occur due to existing faults.
The MVF of the NHPP SRM considering dependent faults can be obtained using the differential equation (4) as shown below.
dm(t)dt=b(t)[a(t)−m(t)]m(t)
(4)
2.2. Novel SRM with dependent faults
As discussed in Section 2.1, many existing SRMs consider that dependent errors persist, if they do occur. However, when most software-dependent faults occur, there is a high probability that faults will increase rapidly from the beginning, and, subsequently, they occur slowly until the maximum number of faults is reached.
In this study, we considered a finite number of software faults and dependent faults.
Thus, the MVF m(t) can be obtained by solving the differential equation (5), with the initial condition m(0)≠0[18]:
dm(t)dt=b(t)[1−m(t)a(t)]m(t)
(5)
Here, a(t) and b(t) represent the maximum number of fault contents in the software and the time-dependent fault detection rate function, respectively.
In this study, the following a(t) and b(t) are considered:
a(t)=a, b(t)=b2tbt+1
We obtained a new NHPP SRM that considers a finite number of faults and dependent faults with the initial condition m(0)=k, which can be expressed as
m(t)=a1+(ak−1)(1+bt)e−bt
3.
Criteria for model comparison and average value of criteria
3.1. Existing NHPP SRMs for comparison
Table 1 summarizes the MVFs of existing NHPP SRMs and the proposed new NHPP SRM. Existing NHPP SRMs 8, 9, 10 and 11 consider the dependency.
In order to compare the performance of the model, we use 12 criteria for model comparison. They are the mean squared error (MSE), the predicted relative variation (PRV), the root mean square prediction error (RMSPE), the sum of absolute errors (SAE), the mean absolute error (MAE), the mean error of prediction (MEOP), the Theil statistics (TS), the predictive ration risk (PRR), Pham's information criterion (PIC), Pham's criterion (PC), R2 and the adjusted R2 (AdjR2). The CVs are obtained by using the difference between the actual value and the predicted value. Some criteria are sensitive to outliers and others are not. This shows the superiority of a given model by comparing many scales without using one scale for various reasons.
In Table 2, yi and ˆm(ti) represent the total number of failures and the estimated cumulative number of failures, respectively. n and m denote the total number of observations and the number of unknown parameters in the model, respectively. In Table 2, from 1–10, the smaller those values, the better the model performance (close to zero). From 11–12, the higher those values, the better the model performance (close to one).
3.3. Average of the normalized criteria and ranking of model
We described 12 criteria in Section 3.1 to compare the performance of NHPP SRMs. Since there are various comparison criteria, it is difficult to select a criterion first and check the performance of the SRM. Therefore, the criterion method to integrate them is needed. Therefore, a new integrated criterion was proposed by considering the value and ranking of each criterion. Earlier, Li and Pham [31] described a criterion for ranking the best models by using the distance of the regularization criterion method.
Because the CVs and rankings for model comparison are different, we have proposed an integrated comparison criterion method that considers the average of each criterion and the average of the rankings of each criterion. The average value of the normalized criteria and ranking (AC value) of the model is defined as follows:
where s is the total number of models; Cij denotes the criterion value of the ith model of the jth criterion, where i=1,2,…,s; d is the total number of certain criteria (MSE, PRV, RMSPE, MAE, MEOP, TS, PIC and PC); f is the total number of the remaining criteria (R2 and AdjR2). k=1 denotes the d and f values of the criteria, and k=2 denotes the d and f rankings of the criteria.
4.
Numerical examples
4.1. Data information
We downloaded all of the fixed issues for products, namely, Apache IoTDB (IoTDB, database for Internet of Things) of the Apache open-source project from the Apache issue tracking system (https://iotdb.apache.org/). Bugs (Bugs), new features (NFs) and feature improvements (IPMs) have been presented with different symbols. Only those issues that did not duplicate and were reproducible for others were selected. Briefly, the Apache IoTDB is an integrated data management engine designed for time-series data. Additional information can be found at https://iotdb.apache.org/. Data were collected for different issue types on a monthly basis from January 2019 to January 2022. The proposed model only considered dependent faults; therefore, we did not consider the independent issue, but reflected the dependent issue and constructed the dataset, as listed in Table 3. In Table 3, Dataset 1 has a cumulative number of failures of 3, 5, ..., 260 at t = 1, 2, ..., 36. Datasets 2–4 have the cumulative number of failures 2,2,…,353; 2,5,…,377; 2,5,…,495, at t=1,2,…,37, respectively.
4.2. Results of parameter estimation for models and comparison
We estimated the parameters of all models listed in Table 1 for Datasets 1–4 based on the least square estimation method using MATLAB (version 2021a) and R (version 4.2.2) programs; the parameter estimates of model are listed in Table 4. Tables 5–8 list the criteria obtained using the estimated parameters listed in Table 4; the best value for each criterion is indicated in bold font.
Table 4.
Parameter estimation of model for Datasets 1–4.
In Table 5, we can observe that the MSE, PRV, RMSE, SAE, MAE, MEOP, TS, PRR, PIC and PC values for the proposed model were the lowest, and that the R2 and Adj R2 values for the proposed model were the largest among all models. As listed in Table 5, the values of MSE, PRV, RMSE, SAE, MAE, MEOP, TS, PRR, PIC and PC for the proposed model were 24.5575, 4.8076, 4.8118,114.1580, 3.4593, 3.3576, 0.7847, 5.3770,862.8971 and 54.5629, respectively, which are lower. The proposed models for the values of R2 and Adj R2 were 0.9950 and 0.9945, respectively, which are higher. Next, the P-DP3 model's MSE, PRV, RMSE, TS, PIC and PC values were 32.6231, 5.3460, 5.4582, 6.1028, 1090.6046 and 58.2508, respectively, which are the second lowest. Moreover, the P-DP3 model's values of R2 and Adj R2 were 0.9935 and 0.9927, respectively, which are the second largest. The SAE, MAE, MEOP and PRR values for the L-DP model were 140.5448, 4.3920, 4.2589 and 1.9926, respectively, which are the second lowest. Figure 1 depicts graphical representations of the MVFs for all models based on Dataset 1. Figure 2 depicts the graphical representation of the relative error values (REVs) of all models for Dataset 1. It is evident that the proposed model is closer to zero at each point of time index compared to other models.
In Table 6, we can observe that the MSE, PRV, RMSE, SAE, MAE, MEOP, TS, PIC and PC values for the proposed model are the lowest, and that the R2 and Adj R2 values for the proposed model are the largest among all the models compared. As listed in Table 6, the values of MSE, PRV, RMSE, SAE, MAE, MEOP, TS, PIC and PC for the proposed model were 41.6728, 6.2699, 6.2735,192.7933, 5.6704, 5.5084, 5.2018, 1470.8747 and 65.1464, respectively, which are lower. The proposed model's values of R2 and Adj R2 were 0.9952 and 0.9948, respectively, which are higher. The PRR value for the L-DP model was 1.6682, which is the lowest. Next, the P-DP3 model's values of MSE, PRV, RMSE, TS, PIC and PC were 46.1444, 6.4682, 6.5028, 5.3927, 1570.7650 and 65.7002, respectively, which are the second lowest. Furthermore, the P-DP3 model's values of R2 and Adj R2 were 0.9949 and 0.9942, respectively, which are the second largest. The SAE, MAE and MEOP values for the L-DP model were 192.7933, 5.8560 and 5.6838, respectively, which are the second lowest. Figure 3 depicts graphical representations of the MVFs for all models based on Dataset 2. Figure 4 depicts the graphical representation of the REVs for all models for Dataset 2.
In Table 7, we can observe that the MSE, PRV, RMSE, TS, PRR, PIC and PC values for the proposed model were the fourth lowest, and that the values of SAE, MAE and MEOP for the proposed model were the fifth lowest when compared to those of the other models. The R2 and Adj R2 values for the proposed model were the fourth largest among all of the models compared. As listed in Table 7, the values of MSE, PRV, RMSE, SAE, MAE, MEOP, TS, PRR, PIC and PC for the proposed model were 141.9586, 11.4880, 11.5765,358.5639, 10.5460, 10.2447, 8.1145, 3.5573, 4880.5910 and 85.9831, respectively. The values of R2 and Adj R2 for the proposed model were 0.9862 and 0.9850, respectively. The values of MSE, PRV, RMSE, SAE, MAE, MEOP, TS, PRR, PIC and PC for the O-IS model were 99.0515, 9.6336, 9.6710,238.4523, 7.0133, 6.8129, 6.7782, 1.8966, 3421.7495 and 79.8649, respectively, which are the lowest. In addition, the values of R2 and Adj R2 for the O-IS model were 0.9904 and 0.9895, respectively, which are the largest. The values of MSE, PRV, RMSE, SAE, MAE, MEOP, TS, PRR, PIC and PC for the L-DP model were 119.1020, 10.4128, 10.4478,296.8038, 8.9941, 8.7295, 7.3225, 2.3600, 3978.3649 and 81.3455, respectively, which are the second lowest. The values of R2 and Adj R2 for the L-DP model were 0.9888 and 0.9874, respectively, which are the second largest.
Figure 5 depicts graphical representations of the MVFs for all models based on Dataset 3. Figure 6 depicts the graphical representation of the REVs of all models for Dataset 3.
In Table 8, we can observe that the MSE, PRV, RMSE, TS, PIC and PC values for the proposed model were the second lowest among all of the models compared. The values of MAE, MEOP and PRR for the proposed model were the third lowest when compared to other models. The R2 and Adj R2 values for the proposed model were the second largest among all of the models compared. As listed in Table 8, the values of MSE, PRV, RMSE, TS, PIC and PC for the proposed model were 115.5631, 10.3995, 10.4459, 5.9602, 3983.1460 and 82.4859, respectively, which are the second lowest. The MAE, MEOP and PRR values for the proposed model were 8.9976, 8.7405 and 3.0198, respectively, which are the third lowest. The values of R2 and Adj R2 for the proposed model were 0.9934 and 0.99927, respectively, which are the second largest values. The values of MSE, PRV, RMSE, SAE, MAE, MEOP, TS, PIC and PC for the P-DP3 model were 114.1997, 10.2304, 10.2314,268.6371, 8.1405, 7.9011, 5.8371, 3816.5911 and 80.6520, respectively, which are the lowest.
Furthermore, the values of R2 and Adj R2 for the P-DP3 model were 0.9936 and 0.9928, respectively, which are the largest. The SAE, MAE and MEOP values for the O-IS model were 293.6791, 8.6376 and 8.3908, respectively, which are the second lowest. The goodness-of-fit of the proposed model was excellent when considering the values of the overall criteria. Figure 7 depicts graphical representations of the MVFs for all models based on Dataset 4. Figure 8 depicts the graphical representation of the REVs of all models for Dataset 4.
4.3. Results of the average of the normalized criteria and ranking for models
In Table 9, we can observe that the AC values for the proposed model on Datasets 1–2 were the lowest among all of the models that were compared. The AC value for the proposed model on Dataset 3 was the fourth lowest. In addition, the AC value for the proposed model on Dataset 4 was the second lowest. For Dataset 3, the AC value for the O-IS model was the lowest. For Dataset 4, the AC value for the P-DP3 model was the lowest. From the AC values, it is evident that the goodness-of-fit of the proposed model is excellent. Figure 9 depicts the graphical representation of the three-dimensional plots for the model, AC values and ranks of the 12 models listed in Table 9 for Datasets 1–4.
Table 9.
AC values for model comparison on Datasets 1–4.
4.4. Results of the sensitivity analysis for software reliability
In this section, we present a sensitivity analysis (SA) to examine the effect of each parameter of the proposed model on software reliability. We analyzed how the software reliability values change when each estimated parameter value from Datasets 1 to 4 changes by 5% from -15% to +15% using Equation (2). Figures 10 depicts the SA for three parameters (a, b, k) in the proposed model based on Dataset 1. As depicted in Figure 10, the estimated software reliability values can be viewed according to each estimated parameter. Parameter a shows that it does not significantly affect the reliability. Parameter b has a greater influence than the other parameters, and it is determined that parameter k also has a slight effect. As can be seen in Figures 11–13, the results of the SA of the reliability are similar.
Figure 10.
SA of the reliability of the proposed model on Dataset 1.
In the era of the fourth industrial revolution, since most core technologies are implemented in software, it is very important to reduce the possibility of software failure and maintain a high level of reliability. Many large companies are performing their own OSS developments, and the development process for OSS is primarily because users find software defects during the usage process and communicate them to the developer, who checks and removes them. We discussed a new SRM that considers the number of finite faults and dependent faults, and we examined the goodness-of-fit based on several criteria by using OSS datasets to show that the new SRM is superior to existing models. Since it is difficult to select the first criterion to confirm the performance excellence of the SRM due to the variety of comparison criteria, we proposed a new integrated criterion considering the value and ranking of each criterion, and the results also demonstrated that the proposed model is superior to other models. In addition, SA was conducted by using the amount of change in each parameter to determine the extent to which the parameter affects software reliability, and it was found that the parameter b had a greater effect than other parameters.
Acknowledgments
This research was supported by the Basic Science Research Program through the National Research Foundation (NRF) of Korea, funded by the Ministry of Education (NRF-2021R1F1A1048592 and NRF-2021R1I1A1A01059842).
Conflict of interest
The authors declare that there is no conflict of interest.
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Mihaela Girtan, Laura Hrostea, Mihaela Boclinca, Beatrice Negulescu. Study of oxide/metal/oxide thin films for transparent electronics and solar cells applications by spectroscopic ellipsometry[J]. AIMS Materials Science, 2017, 4(3): 594-613. doi: 10.3934/matersci.2017.3.594
Mihaela Girtan, Laura Hrostea, Mihaela Boclinca, Beatrice Negulescu. Study of oxide/metal/oxide thin films for transparent electronics and solar cells applications by spectroscopic ellipsometry[J]. AIMS Materials Science, 2017, 4(3): 594-613. doi: 10.3934/matersci.2017.3.594
Figure 2. SEM micrograph of oxide single layer (bottom layer) and oxide/metal/oxide samples bottom and top layer: (a) ITO/Au/ITO, (b) AZO/Au/AZO, (c) TiO2/Au/TiO2, (d) Bi2O3/Au/Bi2O3
Figure 3. XRD diffraction patterns for (a) ITO single layer and ITO/Au/ITO three layer sample, (b) AZO single layer and AZO/Au/AZO three layer sample, (c) TiO2 and TiO2/Au/TiO2, (d) Bi2O3 and Bi2O3/Au/Bi2O3
Figure 4. Best fits between the experimental measurements of ellipsometric angles and (dots) and calculated values (line) using the ellipsometry models given in Figure 7
Figure 5. Samples global refractive index n, for single layer oxide on glass and three layers oxide/metal/oxide layers on glass substrate (experimental—dots and fit—line)
Figure 6. Transmission coefficient from spectrophotometric experimental data and ellipsometric calculations models for single and three layers samples
Figure 7. Ellipsometric models
Figure 8. Refractive index and extinction coefficient for single oxide films
Figure 9. Optical gap calculations from spectrophotometry measurements
Figure 10. The values of ωp2 (ωp = 2πfp, fp—plasma frequency) obtained from the ellipsometric models (Table 6) in function of the measured electrical conductivity in direction parallel to the substrate for the oxide/metal/oxide samples
Catalog
Abstract
1.
Introduction
2.
Dependent SRM
2.1. Generalized SRM of existing research
2.2. Novel SRM with dependent faults
3.
Criteria for model comparison and average value of criteria
3.1. Existing NHPP SRMs for comparison
3.2. Criteria for model comparison
3.3. Average of the normalized criteria and ranking of model
4.
Numerical examples
4.1. Data information
4.2. Results of parameter estimation for models and comparison
4.3. Results of the average of the normalized criteria and ranking for models
4.4. Results of the sensitivity analysis for software reliability