X-ray microscopy in Materials Sciences

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Guest Editor
Dr. Peter Fischer
Center for X-ray Optics, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA
Email: PJFischer@lbl.gov

Manuscript Topics
X-ray microscopies have matured into indispensable characterization tools for materials sciences providing nearly nanoscale spatial resolution including tomographic capabilities with elemental, chemical and magnetic sensitivity, and temporal resolution down to the fsec regime. To document the state-of-the-art and current research directions, we invite leading researchers in this field to submit original research and comprehensive review articles for consideration for publication in a special issue on “X-ray microscopy in Materials Sciences”. These articles will be published in AIMS Materials Science open access free of charge. Submitted papers should not have been previously published nor be currently under consideration for publication elsewhere. All manuscripts will be peer-reviewed before their acceptance for publication.

Paper submission
 All manuscripts will be peer-reviewed before their acceptance for publication.
The deadline for manuscript submission is 31 May 2015

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Nicola Poccia
+ Abstract     + HTML     + PDF(1110 KB)
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+ Abstract     + HTML     + PDF(2826 KB)
Anthony E. Hughes, Y. Sam Yang, Simon G. Hardin, Andrew Tulloh, Yudan Wang, You He
+ Abstract     + HTML     + PDF(2150 KB)
Clemens Liewald, Simon Noever, Stefan Fischer, Janina Roemer, Tobias U. Schülli, Bert Nickel
+ Abstract     + HTML     + PDF(758 KB)
Andrea Somogyi, Cristian Mocuta
+ Abstract     + HTML     + PDF(1313 KB)
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