Advanced microstructural characterization of materials

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Editor's Name
Dr. Haiming Wen
Idaho National Laboratory, Idaho Falls, Idaho, USA
Email: hmwen@ucdavis.edu, haiming.wen@inl.gov

Introduction of the special issue

Microstructural characterization is a vital part in materials science, as it plays a key role in understanding the structure-property relationship in materials. Various advanced microstructural characterization techniques have emerged, and the applications of these techniques have greatly advanced the understanding of material microstructures. We intend to invite researchers to submit original research and comprehensive review articles for consideration for publication in a special issue “advanced microstructural characterization of materials” in the AIMS Materials Science. Topics include advanced microstructural characterization of a variety of materials via different techniques. Materials include but are not limited to metals, alloys, ceramics, polymers and composites. Techniques include but are not limited to scanning electron microscopy, transmission electron microscopy, scanning transmission electron microscopy, high resolution (scanning) transmission electron microscopy, electron backscatter diffraction, energy dispersive x-ray spectroscopy, electron energy loss spectroscopy, precession electron diffraction, energy-filtered transmission electron microscopy, and atom probe tomography. The articles will be published in AIMS Materials Science open access free of charge. Submitted papers should not have been previously published nor be currently under consideration for publication elsewhere. All manuscripts will be peer-reviewed before their acceptance for publication.

Instruction for Authors :
http://www.aimspress.com/news/123.html
Please submit your manuscript to our online submission system:
http://www.aimspress.com/Materials/author.html

Submission due date: 15 April 2016


Haiming Wen
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