X-ray microscopy in Materials Sciences

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Editor's Name 
Dr. Peter Fischer
Center for X-ray Optics, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA
Email: PJFischer@lbl.gov

Introduction of the special issue

X-ray microscopies have matured into indispensable characterization tools for materials sciences providing nearly nanoscale spatial resolution including tomographic capabilities with elemental, chemical and magnetic sensitivity, and temporal resolution down to the fsec regime. To document the state-of-the-art and current research directions, we invite leading researchers in this field to submit original research and comprehensive review articles for consideration for publication in a special issue on “X-ray microscopy in Materials Sciences”. These articles will be published in AIMS Materials Science open access free of charge. Submitted papers should not have been previously published nor be currently under consideration for publication elsewhere. All manuscripts will be peer-reviewed before their acceptance for publication.

Instruction for Authors : http://www.aimspress.com/news/123.htm

Please submit your manuscript to our online submission system: http://oeps.aimspress.com/aimsmates/ch/author/login.aspx

Submission due date: 31 May 2015

Nicola Poccia
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Yu Shiratsuchi, Yoshinori Kotani, Saori Yoshida, Yasunori Yoshikawa, Kentaro Toyoki, Atsushi Kobane, Ryoichi Nakatani, Tetsuya Nakamura
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Anthony E. Hughes, Y. Sam Yang, Simon G. Hardin, Andrew Tulloh, Yudan Wang, You He
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Clemens Liewald, Simon Noever, Stefan Fischer, Janina Roemer, Tobias U. Schülli, Bert Nickel
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Andrea Somogyi, Cristian Mocuta
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